This Special Issue will explore applications of advanced methods of data analysis, such as ML and AI approaches, for Secondary Ion Mass Spectrometry (SIMS). Submit your manuscript by July 31, 2024.
The Journal of the American Society for Mass Spectrometry (JASMS) is welcoming submissions for an upcoming Special Issue on Advanced Data Analysis in Secondary Ion Mass Spectrometry.
Secondary Ion Mass Spectrometry (SIMS) is at an exciting juncture of technological advances in mass spectrometer designs and new ion beams that have rapidly accelerated its capabilities, generating large, complex imaging data sets. These high-resolution data provide new challenges and opportunities for data analysis that are being addressed with multivariate analysis (MVA), machine learning (ML) and artificial intelligence (AI) approaches. However, SIMS and other mass spectrometry imaging (MSI) techniques are currently not used to their full potential due to a lack of uptake and implementation of said methods. Given new developments in ML and AI approaches, this Special Issue from JASMS is timely.
The knowledge in this Special Issue would be directly transferable to matrix-assisted laser desorption/ionization (MALDI) and desorption electrospray ionization (DESI) MSI. Given the use of these technologies in biomedicine, pharmacology and toxicology, materials science, fundamental surface chemistry, food chemistry, and even cultural heritage research, the implications for the wider scientific community are far reaching.
For readers, this Special Issue will be an easily identifiable source of high-quality papers. For authors, the Special Issue will provide a venue of increased visibility for their work.
The deadline for submissions is July 31, 2024. Submit your manuscript now.
Dr. Erin Baker, Associate Editor, JASMS
University of North Carolina at Chapel Hill
Dr. Gustavo F. Trindade, Guest Editor
National Physical Laboratory, United Kingdom
Dr. Sebastiaan Van Nuffel, Guest Editor
Maastricht University, The Netherlands
To submit your manuscript, please visit the Journal of the American Society for Mass Spectrometry website. Please follow the normal procedures for manuscript submission, and when in the ACS Paragon Plus submission site, select the Special Issue: "Advanced Data Analysis in Secondary Ion Mass Spectrometry (SIMS)” from the drop-down menu. All manuscripts will undergo rigorous peer review. For additional submission instructions, please see the Journal of the American Society for Mass Spectrometry Author Guidelines.
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